Limitations of probing field-induced response with STM

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在传统存储产品方面,10nm以下DRAM制造工艺正成为主流,并逐步向7nm工艺突破,通过“FinFET架构+TSV技术”提升密度、降低功耗。3D NAND堆叠层数突破400层后,“垂直堆叠”难度加剧,厂商转向“水平扩展+架构优化”,比如三星V-NAND的阶梯式架构、Kioxia的BiCS架构,同时引入“HKC(高K介质+金属栅)”技术,解决高层数堆叠的漏电、散热问题,制造工艺从“层数竞赛”转向“架构+工艺”双重竞争。

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